| 摘要 |
PURPOSE:To provide a titled device which can monitor the measuring operation of profiles in a real time and makes the smooth measurement with higher accuracy possible by displaying the coordinates of the reflection positions calculated from the projection angle and detection angle of lasers by luminance in accordance with the intensities of the detected lasers. CONSTITUTION:A laser 6a is projected to the deposits 2 on a blast furnace 1, and the reflected laser 6b and the scattered light of the laser 6a are detected with any of the photoelectric transducers 91-9n of a photodetector 9. After the photodetection signals of the transducers 91-9n are sampled and held respectively with a signal processing circuit 10, the signals are outputted to the luminance control terminal Z of a monitor 30 sequentially by selecting an analogue switch 20. On the other hand, the light projection angle of a scanning mirror 7 and the photodetection angle of the detector 9 are detected 50 and 60 respectively. The light projection angle alpha is supplied directly to an arithmetic circuit 80. The photodetection angle betao is supplied thereto after said angle is added with the signal from the circuit 10 in an adder 10 and is converted to the photodetection angle betai for each of the transducers 91-9n. The circuit 80 supplies the coodinates of the reflection positions of the beam 6a or the scattered light to the input terminals X, Y of the monitor 30 in order of calculation with each of the transducers 91-9n, whereby the profiles in the furnace 1 are measured. |
