TEST CIRCUIT FOR MOS INTEGRATED CIRCUITS,申请号GB19800034801-传众专利搜索

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发明名称	TEST CIRCUIT FOR MOS INTEGRATED CIRCUITS
摘要
申请公布号	GB2062879(B)	申请公布日期	1983.08.10
申请号	GB19800034801	申请日期	1980.10.29
申请人	PHILIPS NV	发明人
分类号	G01R31/26;G01R31/28;G01R31/316;G01R31/3185;(IPC1-7):G01R31/28	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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