发明名称 INTEGRATED CIRCUIT
摘要 PURPOSE:To generate inspection data simply without requiring a specific hardware at the side of a board tester by using a constitution wherein an input pin is made corresponding to one vs. one mode logically by the state of an inspection control pin. CONSTITUTION:Three state elements 28, 30 and 32, 34 are connected in parallel respectively between input pins 14, 18 and output pins 12, 16 and these three state elements are connected to an inspection control pin 10 via an inverter 26. In order to carry out a board test, if the inspection control pin is made logic 1, the three state elements 30, 34 are made conductive state so the input pins 14, 18 and the output pins 12, 16 are connected logically one vs. one mode. On the contrary, if the inspection control pin 10 is made as logic 0, the three state elements 28, 32 are made conductive and normal operation is carried out.
申请公布号 JPS62106656(A) 申请公布日期 1987.05.18
申请号 JP19850247618 申请日期 1985.11.05
申请人 NEC CORP 发明人 SEKINE MITSUO
分类号 H01L21/822;G01R31/28;H01L21/66;H01L27/04 主分类号 H01L21/822
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