发明名称 |
METHOD AND DEVICE FOR CHECKING PATTERN |
摘要 |
PURPOSE:To surely detect only the fatal defects even with a circuit pattern including many recessing/projecting pattern edges and with no influence received from these edges by expanding and contracting a detected binary pattern and comparing the connecting relation of the pattern with the normal connecting relation. CONSTITUTION:A mechanism control part 313 actuates an XYZtheta stage 314 and a pattern detector 301 detects an entire surface pattern of a check subject 300. The detected 2-dimensional pattern is binalized by a binalizing circuit 302 and sent to an expanding circuit 303 and a contracting circuit 304 respectively. The picture size is reduced by the picture size reducing circuits 305a and 305b and written into the memories 306 and 307. A connecting relation extracting device 308 reads the contents of both memories 306 and 307 and extracts the connecting relation of the pattern. A microcomputer 309 analyzes the picture data stored in both memories 306 and 307 and produces the defect deciding output 312 of the detect position to the circuit pattern including a defect. |
申请公布号 |
JPH0271377(A) |
申请公布日期 |
1990.03.09 |
申请号 |
JP19880222323 |
申请日期 |
1988.09.07 |
申请人 |
HITACHI LTD |
发明人 |
NINOMIYA TAKANORI;YOSHIMURA KAZUSHI;NOMOTO MINEO;NAKAGAWA YASUO |
分类号 |
G01N21/88;G06T1/00;H01L21/027;H01L21/30;H01L21/66;H05K3/00 |
主分类号 |
G01N21/88 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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