发明名称 半導体装置
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which can sufficiently inhibit leakage current.SOLUTION: A semiconductor device comprises: a substrate; a nitride-based compound semiconductor layer serving as a current path of a principal current formed on the substrate; first and second main electrodes which are arranged on the nitride-based compound semiconductor layer and pass a current to the principal current path; a base part of an outer peripheral electrode which is arranged on the nitride-based compound semiconductor layer so as to surround the first and second main electrodes; and an extension part of the outer peripheral electrode which is provided on the nitride-based compound semiconductor layer via an insulation layer and extends outward from the outer peripheral electrode in plan view.
申请公布号 JP6047998(B2) 申请公布日期 2016.12.21
申请号 JP20120188094 申请日期 2012.08.28
申请人 サンケン電気株式会社 发明人 青木 宏憲
分类号 H01L21/338;H01L21/336;H01L29/41;H01L29/423;H01L29/49;H01L29/778;H01L29/78;H01L29/812 主分类号 H01L21/338
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