发明名称 METHOD AND APPARATUS FOR MEASURING MATERIAL CONSTANT
摘要 PURPOSE: To measure a material constant of a sample without contact. CONSTITUTION: A sample 11 is vibrated by a vibrating means 12. Vertical waves 14 for example among the vertical waves, lateral waves and distortional waves caused by the sample 11 are picked up by a pick-up means 14 to obtain a frequency where an n-order (n=1, 2,...) spectrum of the vertical waves occurs is obtained by a frequency detecting means 23. A convergence operation means 24 performs convergence operation of a material constant of the sample 11 by using a plurality of vibration frequencies detected by the frequency detecting means 23 so that these frequencies satisfy a precalculated relational equation between the material constant of the sample 11 and vibration sound.
申请公布号 JPH08105868(A) 申请公布日期 1996.04.23
申请号 JP19940268441 申请日期 1994.10.06
申请人 IWATSU ELECTRIC CO LTD 发明人 HOSHI AKIRA
分类号 G01B17/00;G01N3/30;G01N29/22;G01N29/44 主分类号 G01B17/00
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