发明名称 半導体装置
摘要 PROBLEM TO BE SOLVED: To provide a molded semiconductor device which corresponds to a high temperature and has high reliability.SOLUTION: A semiconductor device comprises: a semiconductor element 5 which has an electrode formed on a principal surface 5a and a rear face bonded to a circuit surface 6f of a heat spreader 6; a lead frame 3 bonded to the electrode; a coating body 2 which covers the circuit surface 6f so as to surround the semiconductor element 5; and an encapsulation body 1 for encapsulating and wrapping a part of the lead frame, which is bonded to the electrode on the principal surface 5a and the semiconductor element 5 and the coating body 2. The coating body 2 is formed by a material having an elastic modulus lower than that of the encapsulation body 1 and formed at a distance from the semiconductor element 5 in an extension direction of the circuit surface 6f and formed to have a height equal to or higher than a height of the principal surface 5a of the semiconductor element in a height direction from the circuit surface 6f so as not to reach a surface 1f of the encapsulation body 1.
申请公布号 JP6041795(B2) 申请公布日期 2016.12.14
申请号 JP20130254682 申请日期 2013.12.10
申请人 三菱電機株式会社 发明人 六分一 穂隆;山本 圭
分类号 H01L23/50;H01L23/29;H01L23/31;H01L23/34;H01L23/48;H01L25/07;H01L25/18 主分类号 H01L23/50
代理机构 代理人
主权项
地址