发明名称 |
HYDROFLUOROCARBON GAS-ASSISTED PLASMA ETCH FOR INTERCONNECT FABRICATION |
摘要 |
In one embodiment, a method for hydrofluorocarbon gas-assisted plasma etch for interconnect fabrication includes providing a layer of a dielectric material and etching a trench in the layer of the dielectric material, by applying a mixture of an aggressive dielectric etch gas and a polymerizing etch gas to the layer of the dielectric material. In another embodiment, an integrated circuit includes a plurality of semiconductor devices and a plurality of conductive lines connecting the plurality of semiconductor devices. A pitch of the plurality of conductive lines is approximately twenty-eight nanometers. |
申请公布号 |
US2017069508(A1) |
申请公布日期 |
2017.03.09 |
申请号 |
US201514849077 |
申请日期 |
2015.09.09 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION ;Zeon Corporation |
发明人 |
BRUCE ROBERT L.;JOSEPH ERIC A.;LEE JOE;SUZUKI TAKEFUMI |
分类号 |
H01L21/311;H01L23/528;H01L23/532;H01L21/768 |
主分类号 |
H01L21/311 |
代理机构 |
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代理人 |
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主权项 |
1. A method, the method comprising:
providing a layer of a dielectric material; and etching a trench in the layer of the dielectric material, by applying a mixture of a dielectric etch gas and a polymerizing etch gas to the layer of the dielectric material, wherein a ratio of the dielectric etch as to the polymerizing etch gas in the mixture is sufficient to line sidewalls of the trench with a passivation layer as the trench is etched. |
地址 |
Armonk NY US |