发明名称 HYDROFLUOROCARBON GAS-ASSISTED PLASMA ETCH FOR INTERCONNECT FABRICATION
摘要 In one embodiment, a method for hydrofluorocarbon gas-assisted plasma etch for interconnect fabrication includes providing a layer of a dielectric material and etching a trench in the layer of the dielectric material, by applying a mixture of an aggressive dielectric etch gas and a polymerizing etch gas to the layer of the dielectric material. In another embodiment, an integrated circuit includes a plurality of semiconductor devices and a plurality of conductive lines connecting the plurality of semiconductor devices. A pitch of the plurality of conductive lines is approximately twenty-eight nanometers.
申请公布号 US2017069508(A1) 申请公布日期 2017.03.09
申请号 US201514849077 申请日期 2015.09.09
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION ;Zeon Corporation 发明人 BRUCE ROBERT L.;JOSEPH ERIC A.;LEE JOE;SUZUKI TAKEFUMI
分类号 H01L21/311;H01L23/528;H01L23/532;H01L21/768 主分类号 H01L21/311
代理机构 代理人
主权项 1. A method, the method comprising: providing a layer of a dielectric material; and etching a trench in the layer of the dielectric material, by applying a mixture of a dielectric etch gas and a polymerizing etch gas to the layer of the dielectric material, wherein a ratio of the dielectric etch as to the polymerizing etch gas in the mixture is sufficient to line sidewalls of the trench with a passivation layer as the trench is etched.
地址 Armonk NY US