发明名称 PHOTOMASK FOR OPTICAL ALIGNMENT AND OPTICAL ALIGNMENT METHOD
摘要 A photomask(2) for optical alignment and an optical alignment method. By aligning the tail ends of first light-transmission patterns(313) which form a first photomask figure(3), and aligning the front ends of second light-transmission patterns(413) which form a second photomask figure(4) in the photomask(2), the unexposed or underexposed areas do not exist at the tail ends of first substrate units(11) and the front ends of second substrate units(12) during the process of optical alignment, thereby the problem existed in the traditional optical alignment manufacture process, that the brightness of a display is not uniform due to the existing unexposed or underexposed areas, is solved, meanwhile, the reduction of the distance between the first substrate units(11) and the second substrate units(12) on a substrate is facilitated, thereby the utilization rate of the substrate is improved.
申请公布号 WO2017035909(A1) 申请公布日期 2017.03.09
申请号 WO2015CN91721 申请日期 2015.10.12
申请人 SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO.,LTD. 发明人 HAN, Bing
分类号 G03F1/54;G02F1/1337;G03F7/20 主分类号 G03F1/54
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