发明名称 Devices Having a Semiconductor Material That Is Semimetal in Bulk and Methods of Forming the Same
摘要 Devices, and methods of forming such devices, having a material that is semimetal when in bulk but is a semiconductor in the devices are described. An example structure includes a substrate, a first source/drain contact region, a channel structure, a gate dielectric, a gate electrode, and a second source/drain contact region. The substrate has an upper surface. The channel structure is connected to and over the first source/drain contact region, and the channel structure is over the upper surface of the substrate. The channel structure has a sidewall that extends above the first source/drain contact region. The channel structure comprises a bismuth-containing semiconductor material. The gate dielectric is along the sidewall of the channel structure. The gate electrode is along the gate dielectric. The second source/drain contact region is connected to and over the channel structure.
申请公布号 US2017125554(A1) 申请公布日期 2017.05.04
申请号 US201715404712 申请日期 2017.01.12
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Colinge Jean-Pierre;Diaz Carlos H.;Yeo Yee-Chia
分类号 H01L29/66;H01L21/02;H01L21/768;H01L21/8256;H01L29/06;H01L21/477;H01L29/24;H01L21/762;H01L21/426;H01L21/461;H01L29/78;H01L21/441;H01L29/08 主分类号 H01L29/66
代理机构 代理人
主权项 1. A method comprising: forming a first source/drain contact region; forming a first gate electrode over the first source/drain contact region and over a substrate; forming a first opening through the first gate electrode to the first source/drain contact region; forming a first gate dielectric along a first sidewall of the first opening; depositing a first bismuth-containing semiconductor material in the first opening to form a first bismuth-containing channel structure, the first gate dielectric being disposed between the first gate electrode and the first bismuth-containing channel structure, the first bismuth-containing channel structure being connected to the first source/drain contact region; forming a second source/drain contact region over and connected to the first bismuth-containing channel structure; and crystallizing the first bismuth-containing semiconductor material, the crystallizing comprising performing an anneal.
地址 Hsin-Chu TW