发明名称 |
Devices Having a Semiconductor Material That Is Semimetal in Bulk and Methods of Forming the Same |
摘要 |
Devices, and methods of forming such devices, having a material that is semimetal when in bulk but is a semiconductor in the devices are described. An example structure includes a substrate, a first source/drain contact region, a channel structure, a gate dielectric, a gate electrode, and a second source/drain contact region. The substrate has an upper surface. The channel structure is connected to and over the first source/drain contact region, and the channel structure is over the upper surface of the substrate. The channel structure has a sidewall that extends above the first source/drain contact region. The channel structure comprises a bismuth-containing semiconductor material. The gate dielectric is along the sidewall of the channel structure. The gate electrode is along the gate dielectric. The second source/drain contact region is connected to and over the channel structure. |
申请公布号 |
US2017125554(A1) |
申请公布日期 |
2017.05.04 |
申请号 |
US201715404712 |
申请日期 |
2017.01.12 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Colinge Jean-Pierre;Diaz Carlos H.;Yeo Yee-Chia |
分类号 |
H01L29/66;H01L21/02;H01L21/768;H01L21/8256;H01L29/06;H01L21/477;H01L29/24;H01L21/762;H01L21/426;H01L21/461;H01L29/78;H01L21/441;H01L29/08 |
主分类号 |
H01L29/66 |
代理机构 |
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代理人 |
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主权项 |
1. A method comprising:
forming a first source/drain contact region; forming a first gate electrode over the first source/drain contact region and over a substrate; forming a first opening through the first gate electrode to the first source/drain contact region; forming a first gate dielectric along a first sidewall of the first opening; depositing a first bismuth-containing semiconductor material in the first opening to form a first bismuth-containing channel structure, the first gate dielectric being disposed between the first gate electrode and the first bismuth-containing channel structure, the first bismuth-containing channel structure being connected to the first source/drain contact region; forming a second source/drain contact region over and connected to the first bismuth-containing channel structure; and crystallizing the first bismuth-containing semiconductor material, the crystallizing comprising performing an anneal. |
地址 |
Hsin-Chu TW |