发明名称 ON-CHIP SELF CALIBRATION OF IO DRIVER IMPEDANCE FOR PVT VARIATION USING DYNAMICALLY ADJUSTED INTERNAL REFERENCE
摘要 A PVT calibration system of an electronic device may select a temperature band of a plurality of temperature bands based on a detected device temperature. A comparator of the calibration system may compare a process characterization voltage with one or both of an upper bound level and a lower bound level of a reference voltage band associated with the selected temperature band. Based on the comparison, the PVT calibration system may identify a process characterization of the electronic device. The PVT calibration system may use the identification, along with identified device temperature and supply voltage levels to calibrate an impedance of I/O driver circuitry of the electronic device.
申请公布号 US2017123446(A1) 申请公布日期 2017.05.04
申请号 US201514928751 申请日期 2015.10.30
申请人 SanDisk Technologies Inc. 发明人 Siddula Gopikrishna;Mathur Shiv Harit
分类号 G05F3/24 主分类号 G05F3/24
代理机构 代理人
主权项 1. A system comprising: a reference generator configured to output a reference voltage at a level based on a device temperature of an electronic device; and indication circuitry configured to output a process indication signal based on a comparison of the reference voltage and a process detection voltage, wherein a level of the process detection voltage is indicative of a transistor speed of one or more transistors of the electronic device, and wherein the process indication signal indicates a transistor speed characterization of the electronic device.
地址 Plano TX US