发明名称 |
ON-CHIP SELF CALIBRATION OF IO DRIVER IMPEDANCE FOR PVT VARIATION USING DYNAMICALLY ADJUSTED INTERNAL REFERENCE |
摘要 |
A PVT calibration system of an electronic device may select a temperature band of a plurality of temperature bands based on a detected device temperature. A comparator of the calibration system may compare a process characterization voltage with one or both of an upper bound level and a lower bound level of a reference voltage band associated with the selected temperature band. Based on the comparison, the PVT calibration system may identify a process characterization of the electronic device. The PVT calibration system may use the identification, along with identified device temperature and supply voltage levels to calibrate an impedance of I/O driver circuitry of the electronic device. |
申请公布号 |
US2017123446(A1) |
申请公布日期 |
2017.05.04 |
申请号 |
US201514928751 |
申请日期 |
2015.10.30 |
申请人 |
SanDisk Technologies Inc. |
发明人 |
Siddula Gopikrishna;Mathur Shiv Harit |
分类号 |
G05F3/24 |
主分类号 |
G05F3/24 |
代理机构 |
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代理人 |
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主权项 |
1. A system comprising:
a reference generator configured to output a reference voltage at a level based on a device temperature of an electronic device; and indication circuitry configured to output a process indication signal based on a comparison of the reference voltage and a process detection voltage, wherein a level of the process detection voltage is indicative of a transistor speed of one or more transistors of the electronic device, and wherein the process indication signal indicates a transistor speed characterization of the electronic device. |
地址 |
Plano TX US |