发明名称 STANDING WAVE INTERFEROMETRIC MICROSCOPE
摘要 A wide-field interferometric microscope comprising: A specimen holder, for holding a specimen at an analysis location;An illuminator, for illuminating the specimen with input radiation, so as to cause it to emit fluorescence light;A pair of projection systems, arranged at opposite sides of said analysis location, to collect at least a portion of said fluorescence light and direct a corresponding pair of light beams into a respective pair of inputs of an optical combining element, where they optically interfere;A detector arrangement, for examining output light from said combining element, wherein: The illuminator is configured to produce a standing wave of input radiation at the analysis locationThe detector arrangement comprises exactly two interferometric detection branches.
申请公布号 US2017115224(A1) 申请公布日期 2017.04.27
申请号 US201615246512 申请日期 2016.08.24
申请人 FEI Company 发明人 Daum Rainer;Voegele Xaver
分类号 G01N21/64;G02B21/06;G01N21/45;G02B21/08;G02B21/36;G02B21/16;G02B21/18 主分类号 G01N21/64
代理机构 代理人
主权项 1. A wide-field interferometric microscope comprising: a specimen holder, for holding a specimen at an analysis location; an illuminator, for illuminating the specimen with input radiation, so as to cause it to emit fluorescence light; a pair of projection systems, arranged at opposite sides of said analysis location, to collect at least a portion of said fluorescence light and direct a corresponding pair of light beams into a respective pair of inputs of an optical combining element, where they optically interfere; and a detector arrangement, for examining output light from said combining element, wherein: the illuminator comprises an optical cavity that is configured to produce a standing wave of input radiation at the analysis location; and the detector arrangement comprises exactly two interferometric detection branches.
地址 Hillsboro OR US
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