发明名称 Imprint lithography
摘要 An object provided with a particular alignment arrangement for use in aligning the object and a further object with respect to each other is disclosed. The alignment arrangement includes a first fine alignment mark in the form of a substantially regular grating, and a second coarse alignment mark located in the same area as the first alignment mark.
申请公布号 US9625811(B2) 申请公布日期 2017.04.18
申请号 US201013513807 申请日期 2010.10.01
申请人 ASML NETHERLANDS B.V. 发明人 Wuister Sander Frederik;Den Boef Arie Jeffrey;Kruijt-Stegeman Yvonne Wendela
分类号 G03F7/00;B82Y10/00;B82Y40/00;G03F9/00 主分类号 G03F7/00
代理机构 Pillsbury Winthrop Shaw Pittman LLP 代理人 Pillsbury Winthrop Shaw Pittman LLP
主权项 1. An object provided with an alignment arrangement for use in aligning the object and a further object with respect to each other, wherein the object is an imprint lithography template and the further object is a substrate, or the object is a substrate and the further object is an imprint lithography template, the alignment arrangement comprising: a first fine alignment mark in the form of a substantially regular grating of a group of adjacent features having spaces therebetween, the periphery of the group of features defining an area within and the substantially regular grating being a diffraction grating; and a second coarse alignment mark located at least partly within the area, the second coarse alignment mark forming an irregularity in the regular grating of the first fine alignment mark and comprising a non-space feature.
地址 Veldhoven NL