发明名称 METHOD FOR MAKING A MICRO- OR NANO-SCALE PATTERNED LAYER OF MATERIAL BY PHOTOLITHOGRAPHY
摘要 The invention relates to a method for making a micro- or nano-scale patterned layer of material by photolitography, comprising steps of: positioning a photomask between a light source and a layer of light sensitive material, said mask comprising a support and a layer of micro- or nano-light focusing elements fixed to the support,activating the light source so that the light source emits light radiations through the mask towards a surface of the layer of light sensitive material,developing the layer of light sensitive material so as to obtain the micro- or nano-scale patterned layer of material,wherein, during exposure of the layer of light sensitive material to light radiations, the photomask is positioned relative to the light sensitive layer so that the distance between the surface of the light sensitive layer and the layer of micro- or nano-light focusing elements is greater than a back focal length of the micro- or nano-light focusing elements.
申请公布号 US2017102617(A1) 申请公布日期 2017.04.13
申请号 US201514878915 申请日期 2015.10.08
申请人 UNIV PARIS XIII PARIS-NORD VILLETANEUSE ;CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (CNRS) 发明人 FISCHER Alexis;AYENEW Getachew;BOUDRIOUA Azzedine;SOLARD Jeanne
分类号 G03F7/32;G03F7/20 主分类号 G03F7/32
代理机构 代理人
主权项 1. A method for making a micro- or nano-scale patterned layer of material by photolitography, comprising steps of: positioning a photomask between a light source and a layer of light sensitive material, said photomask comprising a support and a layer of micro- or nano-light focusing elements fixed to the support, activating the light source so that the light source emits light radiations through the photomask towards the layer of light sensitive material, developing the layer of light sensitive material so as to obtain the micro- or nano-scale patterned layer of material, wherein, during exposure of the layer of light sensitive material to light radiations, the photomask is held at a distance relative to the light sensitive layer such that the layer of light sensitive material is exposed to: light radiations collected by each micro- or nano-light focusing element and which are focused on the light sensitive layer, and light radiations passing through at least two adjacent micro- or nano-light focusing elements and which interfere constructively with each other,so as to generate, in the layer of light sensitive material, a micro- or nanoscale pattern having a spatial period which is smaller than the spatial period of the layer of micro- or nano-light focusing elements.
地址 VILLETANEUSE FR