发明名称 System and method for testing data packet transceivers having varied performance characteristics and requirements using standard test equipment
摘要 A system and method for testing a wireless data packet signal transceiver device under test (DUT) by using DUT control circuitry separate from a tester to access and execute test program instructions for controlling the DUT during testing with the tester. The test program instructions can be provided previously and stored for subsequent access and execution under control of the tester or an external control source, such a personal computer. Alternatively, the test program instructions can be provided by the tester or external control source immediately prior to testing, such as when beginning testing of a DUT with new or different performance characteristics or requirements. Accordingly, specialized testing of different DUTs while accounting for differences among various chipsets employed by the DUTs can be performed in coordination with a standard tester configuration without need for reconfiguring or reprogramming of the tester.
申请公布号 US9618577(B2) 申请公布日期 2017.04.11
申请号 US201414147159 申请日期 2014.01.03
申请人 LitePoint Corporation 发明人 Olgaard Christian Volf
分类号 G01R31/28;G01R31/3177;H04B10/00;G01M11/00;H04B10/073 主分类号 G01R31/28
代理机构 Banner & Witcoff, Ltd. 代理人 Banner & Witcoff, Ltd.
主权项 1. An apparatus including a system for testing data packet signal transceiver device under test (DUT), comprising: a data packet signal path for communicating with a DUT to convey a transmit data packet signal from said DUT and a receive data packet signal to said DUT; an external command source to provide one or more test commands related to said transit data packet signal; a tester coupled to said external command source and said data packet signal path to receive said transmit data packet signal and provide said receive data packet signal, and responsive to said one or more test commands by providing one or more test control signals; a DUT control signal interface for communicating with said DUT to convey at least one DUT control signal to said DUT; and DUT control circuitry coupled between said external command source, said tester and said DUT control signal interface, and responsive to at least one of said one or more test control signals, andsaid one or more test commands, by performing at least one of executing a plurality of test program operations to provide said at least one DUT control signal,providing another DUT control signal to initiate transmission of said transmit data packet signal from said DUT,providing another DUT control signal to terminate transmission of said transmit data packet signal from said DUT, andproviding another DUT control signal to initiate reception of said receive data packet signal to said DUT; wherein said external command source provides said one or more test commands to enable testing of said DUT, following which said tester, responsive to said one or more test commands, provides said one or more test control signals, andsaid DUT control circuitry, responsive to at least one of said one or more test control signals and said one or more test commands, controls said testing of said DUT by performing at least one of said executing and providing steps.
地址 Sunnyvale CA US