发明名称 Method and apparatus for imaging three-dimensional structure
摘要 An apparatus for determining surface topology of a portion of a three-dimensional structure is provided, that includes a probing member, an illumination unit, a light focusing optics, a translation mechanism, a detector and a processor.
申请公布号 US9615901(B2) 申请公布日期 2017.04.11
申请号 US201514743765 申请日期 2015.06.18
申请人 Align Technology, Inc. 发明人 Babayoff Noam;Glaser-Inbari Isaia
分类号 G01B11/24;A61C9/00;A61B1/24;A61B5/00;A61B5/107;A61C13/00;G01B11/25;A61B1/06;A61B1/00 主分类号 G01B11/24
代理机构 Wilson Sonsini Goodrich & Rosati 代理人 Wilson Sonsini Goodrich & Rosati
主权项 1. An apparatus for determining surface topology of a portion of a three-dimensional structure, the apparatus comprising: a probing member; an illumination unit configured to generate a plurality of incident light beams; an optical system configured to focus the plurality of incident light beams to a focal plane external to the probing member so as to illuminate the portion of the three-dimensional structure; a detector unit configured to measure a characteristic of a plurality of returned light beams generated from illuminating the portion of the three-dimensional structure with the plurality of incident light beams; and a processor coupled to the detector unit and configured to determine a surface topology of the portion of the three-dimensional structure based at least in part on the measured characteristic of the plurality of returned light beams.
地址 San Jose CA US