发明名称 |
Method and apparatus for imaging three-dimensional structure |
摘要 |
An apparatus for determining surface topology of a portion of a three-dimensional structure is provided, that includes a probing member, an illumination unit, a light focusing optics, a translation mechanism, a detector and a processor. |
申请公布号 |
US9615901(B2) |
申请公布日期 |
2017.04.11 |
申请号 |
US201514743765 |
申请日期 |
2015.06.18 |
申请人 |
Align Technology, Inc. |
发明人 |
Babayoff Noam;Glaser-Inbari Isaia |
分类号 |
G01B11/24;A61C9/00;A61B1/24;A61B5/00;A61B5/107;A61C13/00;G01B11/25;A61B1/06;A61B1/00 |
主分类号 |
G01B11/24 |
代理机构 |
Wilson Sonsini Goodrich & Rosati |
代理人 |
Wilson Sonsini Goodrich & Rosati |
主权项 |
1. An apparatus for determining surface topology of a portion of a three-dimensional structure, the apparatus comprising:
a probing member; an illumination unit configured to generate a plurality of incident light beams; an optical system configured to focus the plurality of incident light beams to a focal plane external to the probing member so as to illuminate the portion of the three-dimensional structure; a detector unit configured to measure a characteristic of a plurality of returned light beams generated from illuminating the portion of the three-dimensional structure with the plurality of incident light beams; and a processor coupled to the detector unit and configured to determine a surface topology of the portion of the three-dimensional structure based at least in part on the measured characteristic of the plurality of returned light beams. |
地址 |
San Jose CA US |