发明名称 MAGNETORESISTIVE RANDOM ACCESS MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 A method of manufacturing a magnetoresistive random access memory device, the method including forming a memory structure on a substrate, the memory structure including a lower electrode, a magnetic tunnel junction structure, and an upper electrode sequentially stacked; forming a first capping layer to cover a surface of the memory structure by a deposition process using a plasma under first conditions; and forming a second capping layer on the first capping layer by a deposition process using a plasma under second conditions different from the first conditions.
申请公布号 US2017092847(A1) 申请公布日期 2017.03.30
申请号 US201615177597 申请日期 2016.06.09
申请人 KIM Jong-Uk;LEE Jung-Moo;PARK Soon-Oh;PARK Jung-Hwan;JUNG Sug-Woo 发明人 KIM Jong-Uk;LEE Jung-Moo;PARK Soon-Oh;PARK Jung-Hwan;JUNG Sug-Woo
分类号 H01L43/08;G11C11/16;H01L27/22;H01L43/10;H01L43/12;H01L43/02 主分类号 H01L43/08
代理机构 代理人
主权项 1. A method of manufacturing a magnetoresistive random access memory device, the method comprising: forming a memory structure on a substrate, the memory structure including a lower electrode, a magnetic tunnel junction structure, and an upper electrode sequentially stacked; forming a first capping layer to cover a surface of the memory structure by a deposition process using a plasma under first conditions; and forming a second capping layer on the first capping layer by a deposition process using a plasma under second conditions different from the first conditions.
地址 Yongin-si KR