发明名称 Context-aware reliability checks
摘要 Embodiments of an electromigration (EM) check scheme to reduce a pessimism on current density limits by checking wire context. This methodology, in an embodiment, includes applying existing electronic design automation (EDA) flows and tools to identify potentially-failing wires based on a worst-case EM check using conservative foundry current density limits. A more accurate, context-specific check can be performed on the potentially-failing wires to eliminate one or more of the potentially-failing wires if those wires do not experience worst-case conditions and meet current density limits based on an actual context of those wires. A designer can correct remaining wires which are not eliminated by the context-specific check.
申请公布号 US9607125(B1) 申请公布日期 2017.03.28
申请号 US201514732971 申请日期 2015.06.08
申请人 Apple Inc. 发明人 Oliva Antonietta;Rajagopal Karthik;Gopalan Manoj;Nanua Mini;Narayan Sambasivan
分类号 G06F17/50 主分类号 G06F17/50
代理机构 Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C. 代理人 Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C. ;Merkel Lawrence J.
主权项 1. A non-transitory computer accessible storage medium storing a plurality of instructions that, when executed by one or more processors in a computer system, cause the one or more processors to: (a) identify a plurality of potentially-failing wires in a circuit design according to a specified current limit, wherein the plurality of potentially-failing wires exclude one or more wires in the circuit design that meet the specified current limit; (b) for a given wire of the plurality of potentially-failing wires, examine wires within a window of a predetermined size around the given wire according to one or more criteria indicating electromigration or Joule heating contribution to the given wire; (c) determine a second current limit for the given wire responsive to examining the wires within the window, wherein the second current limit is greater than or equal to the specified current limit dependent upon a result of examining the wires within the window; (d) eliminate the given wire from the plurality of potentially-failing wires responsive to a current in the given wire meeting the second current limit; and repeat (b), (c), and (d) for each other wire of the plurality of potentially-failing wires.
地址 Cupertino CA US