发明名称 Capacitive coupling plasma processing apparatus and method for using the same
摘要 A plasma processing apparatus includes a process container configured to accommodate a target substrate and to be vacuum-exhausted. A first electrode and a second electrode are disposed opposite each other within the process container. The first electrode includes an outer portion and an inner portion both facing the second electrode such that the outer portion surrounds the inner portion. An RF power supply is configured to apply an RF power to the outer portion of the first electrode. A DC power supply is configured to apply a DC voltage to the inner portion of the first electrode. A process gas supply unit is configured to supply a process gas into the process container, wherein plasma of the process gas is generated between the first electrode and the second electrode.
申请公布号 US9607866(B2) 申请公布日期 2017.03.28
申请号 US201313932567 申请日期 2013.07.01
申请人 TOKYO ELECTRON LIMITED 发明人 Matsumoto Naoki;Koshimizu Chishio;Koshiishi Akira
分类号 C23C16/00;C23F1/00;H01L21/306;H01L21/67;C23F4/00;H01J37/32 主分类号 C23C16/00
代理机构 Oblon, McClelland, Maier & Neustadt, L.L.P. 代理人 Oblon, McClelland, Maier & Neustadt, L.L.P.
主权项 1. A plasma processing apparatus comprising: a process container configured to accommodate a target substrate and to be vacuum-exhausted; an upper electrode and a lower electrode disposed opposite each other inside the process container, the lower electrode being configured to place the target substrate thereon, the upper electrode including an outer portion and an inner portion such that the outer portion surrounds the inner portion and is decoupled for direct current (DC) relative to the inner portion; a first radio frequency (RF) power supply configured apply a first RF power across the upper electrode and the lower electrode; a DC power supply configured to apply a DC voltage to the upper electrode; and a process gas supply system configured to supply a process gas into the process container such that plasma of the process gas is generated between the upper electrode and the lower electrode to perform a plasma process on the target substrate; a control section configured to control an operation of the apparatus, wherein the first RF power supply is connected to the outer portion of the upper electrode through an electricity feeder without being connected to either of the inner portion of the upper electrode and the lower electrode, the DC power supply is connected to the inner portion of the upper electrode through another electricity feeder without being connected to either of the outer portion of the upper electrode and the lower electrode, and the control section includes a non-transitory storage medium that stores a program for execution on a computer to control the apparatus, which, when executed, controls the apparatus to apply the DC voltage from the DC power supply during the plasma process and to stop application of the DC voltage from the DC power supply during a cleaning process inside the process container.
地址 Minato-ku JP