发明名称 |
Photo mask including pre-alignment keys and photolithography apparatus performing a pre-alignment process for the photo mask |
摘要 |
A photo mask includes a pre-alignment key used in a pre-alignment process performed in a photolithography apparatus. The pre-alignment key includes a pre-alignment pattern including a light transmitting area and a light blocking area surrounding the pre-alignment pattern. The light blocking area includes a plurality of light blocking patterns and a diffraction grating pattern separating the plurality of light blocking patterns from each other. |
申请公布号 |
US9599887(B2) |
申请公布日期 |
2017.03.21 |
申请号 |
US201514850835 |
申请日期 |
2015.09.10 |
申请人 |
SK HYNIX INC. |
发明人 |
Nam Byung Ho |
分类号 |
G03F1/42 |
主分类号 |
G03F1/42 |
代理机构 |
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代理人 |
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主权项 |
1. A photo mask including a pre-alignment key used in a pre-alignment process performed in a photolithography apparatus, wherein the pre-alignment key comprises:
a pre-alignment pattern including a light transmitting area; and a light blocking area surrounding the pre-alignment pattern, wherein the light blocking area includes a plurality of light blocking patterns and a diffraction grating pattern separating the plurality of light blocking patterns from each other. |
地址 |
Icheon KR |