发明名称 Photo mask including pre-alignment keys and photolithography apparatus performing a pre-alignment process for the photo mask
摘要 A photo mask includes a pre-alignment key used in a pre-alignment process performed in a photolithography apparatus. The pre-alignment key includes a pre-alignment pattern including a light transmitting area and a light blocking area surrounding the pre-alignment pattern. The light blocking area includes a plurality of light blocking patterns and a diffraction grating pattern separating the plurality of light blocking patterns from each other.
申请公布号 US9599887(B2) 申请公布日期 2017.03.21
申请号 US201514850835 申请日期 2015.09.10
申请人 SK HYNIX INC. 发明人 Nam Byung Ho
分类号 G03F1/42 主分类号 G03F1/42
代理机构 代理人
主权项 1. A photo mask including a pre-alignment key used in a pre-alignment process performed in a photolithography apparatus, wherein the pre-alignment key comprises: a pre-alignment pattern including a light transmitting area; and a light blocking area surrounding the pre-alignment pattern, wherein the light blocking area includes a plurality of light blocking patterns and a diffraction grating pattern separating the plurality of light blocking patterns from each other.
地址 Icheon KR