发明名称 MULTI-LAYER POLISHING PAD FOR CMP
摘要 The invention is directed to a multi-layer polishing pad for chemical-mechanical polishing comprising a top layer, a middle layer and a bottom layer, wherein the top layer and bottom layer are joined together by the middle layer, and without the use of an adhesive. The invention is also directed to a multi-layer polishing pad comprising an optically transmissive region, wherein the layers of the multi-layer polishing pad are joined together without the use of an adhesive.
申请公布号 EP3140852(A1) 申请公布日期 2017.03.15
申请号 EP20150788762 申请日期 2015.04.30
申请人 Cabot Microelectronics Corporation;Mrzyglod, Brian;Nair, Jayakrishnan;Blake, Garrett 发明人 MRZYGLOD, Brian;NAIR, Jayakrishnan;BLAKE, Garrett
分类号 H01L21/304 主分类号 H01L21/304
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