发明名称 基板処理装置及び基板処理方法
摘要 PROBLEM TO BE SOLVED: To provide a substrate processing apparatus which inhibits the occurrence of warpage of a wafer with high efficiency.SOLUTION: A substrate processing apparatus for performing processing on a substrate by continuously rotating a rotary table in a state where the substrate is placed on a recess for substrate placement, the substrate being formed on a surface of the rotary table provided in a chamber in a substantially horizontal fashion, comprises: heating means arranged near a carry-in/carry-out region for placing the substrate on the rotary table, for heating the substrate; and control means for controlling the heating means to heat the substrate carried in the carry-in/carry-out region and on a surface on the side opposite to the substrate placement surface of the rotary table and in a region including at least an edge of the substrate.
申请公布号 JP6096588(B2) 申请公布日期 2017.03.15
申请号 JP20130107474 申请日期 2013.05.21
申请人 東京エレクトロン株式会社 发明人 加藤 寿;三浦 繁博
分类号 H01L21/205;C23C16/46;H01L21/683 主分类号 H01L21/205
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