| 发明名称 |
CONDUCTIVE TEMPERATURE CONTROL |
| 摘要 |
A test system includes a transporter having test sockets, where each test socket is configured to receive a device to be tested by the test system, and each test socket includes an element that is controllable to change a temperature of a device in the test socket through thermal conduction. The test system includes a test rack comprising slots. The transporter is configured for movement into, and out of, a slot of the test rack to test devices in the test sockets. |
| 申请公布号 |
US2017059635(A1) |
申请公布日期 |
2017.03.02 |
| 申请号 |
US201514841369 |
申请日期 |
2015.08.31 |
| 申请人 |
TERADYNE INC. |
发明人 |
Orchanian Shant;Carvalho Valquirio N.;Campbell Philip;Pollack Matthew David |
| 分类号 |
G01R31/00;G01R31/28;B25J18/04;G01R1/04 |
主分类号 |
G01R31/00 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A test system comprising:
a transporter having test sockets, each test socket being configured to receive a device to be tested by the test system, each test socket comprising an element that is controllable to change a temperature of a device in the test socket through thermal conduction; and a test rack comprising slots, the transporter being configured for movement into, and out of, a slot of the test rack to test devices in the test sockets. |
| 地址 |
North Reading MA US |
