SEMICONDUCTOR CIRCUIT HAVING TEST FUNCTION

摘要

A semiconductor circuit having a test function is operated by applying power between a first pad and a second pad, and includes a first circuit block including a circuit for performing a main function of the semiconductor circuit; a second circuit block including a circuit for performing a function of testing the semiconductor circuit; and a diode connected in series with the second circuit block. In accordance with the semiconductor circuit having a test function, additional control pads and control signals are not required, thus suppressing an increase in the area of a semiconductor chip due to pads by reducing the number of pads.

主权项

1. A semiconductor circuit having a test function, comprising:
a first circuit block including a circuit for performing a main function of the semiconductor circuit; a first power control block for controlling supply of power to the first circuit block; a second circuit block including a circuit for performing a function of testing the semiconductor circuit; and a second power control block for controlling supply of power to the second circuit block.