发明名称 |
Etchant and Etching Process |
摘要 |
A system and method for manufacturing semiconductor devices is provided. An embodiment comprises using an etchant to remove a portion of a substrate to form an opening with a 45° angle with a major surface of the substrate. The etchant comprises a base, a surfactant, and an oxidant. The oxidant may be hydrogen peroxide. |
申请公布号 |
US2017045685(A1) |
申请公布日期 |
2017.02.16 |
申请号 |
US201615339446 |
申请日期 |
2016.10.31 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Lee Wan-Yu;Kuo Ying-Hao;Chen Hai-Ching;Bao Tien-I |
分类号 |
G02B6/136;G02B6/122;C09K13/02;H01L21/306;H01L21/308 |
主分类号 |
G02B6/136 |
代理机构 |
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代理人 |
|
主权项 |
1. A semiconductor material etchant comprising:
a base for removing material from a waveguide substrate covered with a patterned hardmask, the base having a concentration of between 25%-wt and about 35%-wt; a surfactant for modifying an angle of etching to about 45% from a major surface of the waveguide substrate, the surfactant reactable on the waveguide substrate to form an oil by-product, the surfactant having a concentration of between about 0.01%-wt and about 0.4%-wt; and an oxidant for oxidizing the waveguide substrate beneath the oil by-product, the oxidant having a concentration of between about 0.1%-wt and about 0.2%-wt. |
地址 |
Hsin-Chu TW |