发明名称 Etchant and Etching Process
摘要 A system and method for manufacturing semiconductor devices is provided. An embodiment comprises using an etchant to remove a portion of a substrate to form an opening with a 45° angle with a major surface of the substrate. The etchant comprises a base, a surfactant, and an oxidant. The oxidant may be hydrogen peroxide.
申请公布号 US2017045685(A1) 申请公布日期 2017.02.16
申请号 US201615339446 申请日期 2016.10.31
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Lee Wan-Yu;Kuo Ying-Hao;Chen Hai-Ching;Bao Tien-I
分类号 G02B6/136;G02B6/122;C09K13/02;H01L21/306;H01L21/308 主分类号 G02B6/136
代理机构 代理人
主权项 1. A semiconductor material etchant comprising: a base for removing material from a waveguide substrate covered with a patterned hardmask, the base having a concentration of between 25%-wt and about 35%-wt; a surfactant for modifying an angle of etching to about 45% from a major surface of the waveguide substrate, the surfactant reactable on the waveguide substrate to form an oil by-product, the surfactant having a concentration of between about 0.01%-wt and about 0.4%-wt; and an oxidant for oxidizing the waveguide substrate beneath the oil by-product, the oxidant having a concentration of between about 0.1%-wt and about 0.2%-wt.
地址 Hsin-Chu TW