发明名称 半導体素子
摘要 PROBLEM TO BE SOLVED: To provide a sufficiently strong termination structure on a surface of a SiC substrate, a method of forming the same, and a semiconductor element using the same.SOLUTION: In a semiconductor element comprising at least a SiC substrate and a gate insulating film formed on the SiC substrate, at an interface between the SiC substrate and the gate insulating film, a part of either or both of elements of Si and C on the topmost surface of the SiC substrate is substituted with nitrogen.
申请公布号 JP6072122(B2) 申请公布日期 2017.02.01
申请号 JP20150076934 申请日期 2015.04.03
申请人 株式会社東芝 发明人 清水 達雄;四戸 孝
分类号 H01L29/78;H01L21/22;H01L21/265;H01L21/324;H01L21/336;H01L29/12;H01L29/739 主分类号 H01L29/78
代理机构 代理人
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