发明名称 Method and apparatus for a high resolution imaging system
摘要 The present invention provides apparatus for an imaging system comprising a multitude of imaging elements upon a substrate. In some embodiments the substrate may be approximately round with a radius of approximately one inch. Various methods relating to using and producing an imaging system are discussed.
申请公布号 US9558915(B2) 申请公布日期 2017.01.31
申请号 US201514861737 申请日期 2015.09.22
申请人 Flitsch Frederick A. 发明人 Flitsch Frederick A.
分类号 H01J37/317;H01J37/248;H01J37/20;B82B3/00;H01J37/06;H01J37/08;H01J9/02 主分类号 H01J37/317
代理机构 Ideation Law PLLC 代理人 Kincart Joseph;Ideation Law PLLC
主权项 1. An imaging apparatus comprising: a first apparatus comprising a first substrate with a multitude of imaging elements arrayed thereupon, wherein the imaging elements are capable of emitting an imaging signal from their structure to a material sensitive to their emissions on a surface in a vicinity of the first apparatus, wherein the imaging elements are emission tips formed into silicon deposited into trenches, and wherein the emission tips protrude from a backside of a base layer into a front-side of which the trenches are etched, and wherein there are more than 1000 emission tips in the first apparatus; a support component for a second substrate to be processed by the imaging apparatus; an alignment feature and alignment apparatus to measure the alignment feature; and a processor operant to collect data from imaging apparatus components, process the data and control imaging apparatus components based on the data.
地址 New Windsor NY US