发明名称 |
Method and apparatus for a high resolution imaging system |
摘要 |
The present invention provides apparatus for an imaging system comprising a multitude of imaging elements upon a substrate. In some embodiments the substrate may be approximately round with a radius of approximately one inch. Various methods relating to using and producing an imaging system are discussed. |
申请公布号 |
US9558915(B2) |
申请公布日期 |
2017.01.31 |
申请号 |
US201514861737 |
申请日期 |
2015.09.22 |
申请人 |
Flitsch Frederick A. |
发明人 |
Flitsch Frederick A. |
分类号 |
H01J37/317;H01J37/248;H01J37/20;B82B3/00;H01J37/06;H01J37/08;H01J9/02 |
主分类号 |
H01J37/317 |
代理机构 |
Ideation Law PLLC |
代理人 |
Kincart Joseph;Ideation Law PLLC |
主权项 |
1. An imaging apparatus comprising:
a first apparatus comprising a first substrate with a multitude of imaging elements arrayed thereupon, wherein the imaging elements are capable of emitting an imaging signal from their structure to a material sensitive to their emissions on a surface in a vicinity of the first apparatus, wherein the imaging elements are emission tips formed into silicon deposited into trenches, and wherein the emission tips protrude from a backside of a base layer into a front-side of which the trenches are etched, and wherein there are more than 1000 emission tips in the first apparatus; a support component for a second substrate to be processed by the imaging apparatus; an alignment feature and alignment apparatus to measure the alignment feature; and a processor operant to collect data from imaging apparatus components, process the data and control imaging apparatus components based on the data. |
地址 |
New Windsor NY US |