发明名称 Semiconductor memory device and operating method thereof
摘要 A semiconductor memory device includes a plurality of memory cells connected to a plurality of word lines; a peripheral circuit suitable for applying a program pulse to at least one of the word lines, performing a program verification operation to the plurality of memory cells by using a first program verification voltage; and a control logic suitable for controlling the peripheral circuit to repeat the applying of the program pulse and the performing the program verification operation until program verification passes by increasing a level of the program pulse by an amount of a step voltage at each repetition, wherein a size of the step voltage decreases at each repetition.
申请公布号 US9552883(B1) 申请公布日期 2017.01.24
申请号 US201614990230 申请日期 2016.01.07
申请人 SK Hynix Inc. 发明人 Jung Sung Wook
分类号 G11C11/34;G11C16/12;G11C16/34 主分类号 G11C11/34
代理机构 IP & T Group LLP 代理人 IP & T Group LLP
主权项 1. A method of operating a semiconductor memory device including a plurality of memory cells connected to a word line, the method comprising: applying a program pulse to the word line; performing a program verification operation to the plurality of memory cells using a first program verification voltage; repeating the applying of the program pulse and the performing the program verification operation until program verification passes by increasing a level of the program pulse by an amount of a step voltage at each repetition; determining, when the program verification passes, a dummy pulse voltage; and applying the dummy pulse voltage to the word line, wherein the step voltage decreases at each repetition.
地址 Gyeonggi-do KR