发明名称 |
Semiconductor memory device and operating method thereof |
摘要 |
A semiconductor memory device includes a plurality of memory cells connected to a plurality of word lines; a peripheral circuit suitable for applying a program pulse to at least one of the word lines, performing a program verification operation to the plurality of memory cells by using a first program verification voltage; and a control logic suitable for controlling the peripheral circuit to repeat the applying of the program pulse and the performing the program verification operation until program verification passes by increasing a level of the program pulse by an amount of a step voltage at each repetition, wherein a size of the step voltage decreases at each repetition. |
申请公布号 |
US9552883(B1) |
申请公布日期 |
2017.01.24 |
申请号 |
US201614990230 |
申请日期 |
2016.01.07 |
申请人 |
SK Hynix Inc. |
发明人 |
Jung Sung Wook |
分类号 |
G11C11/34;G11C16/12;G11C16/34 |
主分类号 |
G11C11/34 |
代理机构 |
IP & T Group LLP |
代理人 |
IP & T Group LLP |
主权项 |
1. A method of operating a semiconductor memory device including a plurality of memory cells connected to a word line, the method comprising:
applying a program pulse to the word line; performing a program verification operation to the plurality of memory cells using a first program verification voltage; repeating the applying of the program pulse and the performing the program verification operation until program verification passes by increasing a level of the program pulse by an amount of a step voltage at each repetition; determining, when the program verification passes, a dummy pulse voltage; and applying the dummy pulse voltage to the word line, wherein the step voltage decreases at each repetition. |
地址 |
Gyeonggi-do KR |