发明名称 SEMICONDUCTOR LIGHT-EMITTING ELEMENT
摘要 Provided is a semiconductor light emitting element formed by growing an active layer in the c-axis direction and having a peak emission wavelength of at least 530 nm, wherein the light emission efficiency is greater than the conventional art. A semiconductor light-emitting element has a peak emission wavelength of greater than or equal to 530 nm, and comprise: an n-type semiconductor layer; an active layer formed above n-type semiconductor layer; and a p-type semiconductor layer formed above the active layer. In the active layer, a first layer composed of InX1Ga1-X1N (0≦X1≦0.01), a second layer composed of InX2Ga1-X2N (0.2<X2<1), and a third layer composed of AlY1Ga1-Y1N (0<Y1<1) are laminated, and at least the first layer and the second layer are formed cyclically.
申请公布号 US2017012166(A1) 申请公布日期 2017.01.12
申请号 US201515116268 申请日期 2015.02.02
申请人 Ushio Denki Kabushiki Kaisha 发明人 MIYOSHI Kohei
分类号 H01L33/04;H01L33/32 主分类号 H01L33/04
代理机构 代理人
主权项 1. A semiconductor light-emitting element having a peak emission wavelength of greater than or equal to 530 nm, comprising: an n-type semiconductor layer; an active layer formed above the superlattice layer n type semiconductor layer; and a p-type semiconductor layer formed above the active layer, wherein in the active layer, a first layer composed of In1Ga1-X1N (0≦X1≦0.01), a second layer composed of InX2Ga1-X2N (0.2<X2<1), and a third layer composed of AlY1Ga1-Y1N (0<Y1<1) are laminated, and at least the first layer and the second layer are formed cyclically; the second layer is composed of InX2Ga1-X2N (0.28≦X2≦0.33) having a film thickness of greater than or equal to 2.4 nm and less than or equal to 2.8 nm; and letting a film thickness of the first layer be T1, a film thickness of the second layer be T2, and a film thickness of the third layer be T3, relations of 5T2 <T1 <10T2 and T3 <T2 are satisfied.
地址 Tokyo JP