发明名称 荷電粒子ビーム描画装置及び荷電粒子ビーム描画方法
摘要 A charged particle beam writing apparatus includes a dose calculation unit to calculate, for each of a plurality of first small regions made by virtually dividing a writing region of a target object to be mesh-like regions each having a size larger than an influence radius of forward scattering of a charged particle beam, a dose of the charged particle beam shot in a first small region concerned of the plurality of first small regions, by using a dose formula which is different depending on a shot type classified by whether a shot figure formed by the charged particle beam is at an edge of a figure pattern or inside the figure pattern in the first small region concerned, and a writing unit to write, for each of the plurality of first small regions, the figure pattern with a dose calculated by the dose formula.
申请公布号 JP6057635(B2) 申请公布日期 2017.01.11
申请号 JP20120202849 申请日期 2012.09.14
申请人 株式会社ニューフレアテクノロジー 发明人 松本 裕信
分类号 H01L21/027;G03F7/20;H01J37/04;H01J37/305 主分类号 H01L21/027
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