发明名称 |
Frequency tuning for pulsed radio frequency plasma processing |
摘要 |
This disclosure describes systems, methods, and apparatus for pulsed RF power delivery to a plasma load for plasma processing of a substrate. In order to maximize power delivery, a calibration phase using a dummy substrate or no substrate in the chamber, is used to ascertain a preferred fixed initial RF frequency for each pulse. This fixed initial RF frequency is then used at the start of each pulse during a processing phase, where a real substrate is used and processed in the chamber. |
申请公布号 |
US9544987(B2) |
申请公布日期 |
2017.01.10 |
申请号 |
US201414320268 |
申请日期 |
2014.06.30 |
申请人 |
Advanced Energy Industries, Inc. |
发明人 |
Mueller Michael;Choi Myeong Yeol |
分类号 |
H05H1/46;H01J37/32 |
主分类号 |
H05H1/46 |
代理机构 |
Neugeboren O'Dowd PC |
代理人 |
Neugeboren O'Dowd PC |
主权项 |
1. A method of selecting a fixed initial RF frequency for each of a plurality of RF pulses provided to a plasma load, the method comprising:
providing pulsed RF power to a plasma load, where each pulse comprises RF power having a controllable frequency, and where a plasma having the plasma load interacts with a dummy substrate, or no substrate, in a plasma chamber; tuning an initial RF frequency for each pulse in a string of pulses, pulse to pulse, in a calibration process, by minimizing a difference between a characteristic indicative of the pulsed RF power at a start of each pulse and a desired characteristic of the pulsed RF power at a start of each pulse until the difference between the characteristic for a start to two consecutive pulses is below a threshold; then selecting the initial RF frequency as a fixed initial RF frequency for use in a processing run using a real substrate; and tuning the RF frequency during processing within each pulse but returning to the fixed initial RF frequency at a start of each pulse. |
地址 |
Fort Collins CO US |