发明名称 Frequency tuning for pulsed radio frequency plasma processing
摘要 This disclosure describes systems, methods, and apparatus for pulsed RF power delivery to a plasma load for plasma processing of a substrate. In order to maximize power delivery, a calibration phase using a dummy substrate or no substrate in the chamber, is used to ascertain a preferred fixed initial RF frequency for each pulse. This fixed initial RF frequency is then used at the start of each pulse during a processing phase, where a real substrate is used and processed in the chamber.
申请公布号 US9544987(B2) 申请公布日期 2017.01.10
申请号 US201414320268 申请日期 2014.06.30
申请人 Advanced Energy Industries, Inc. 发明人 Mueller Michael;Choi Myeong Yeol
分类号 H05H1/46;H01J37/32 主分类号 H05H1/46
代理机构 Neugeboren O'Dowd PC 代理人 Neugeboren O'Dowd PC
主权项 1. A method of selecting a fixed initial RF frequency for each of a plurality of RF pulses provided to a plasma load, the method comprising: providing pulsed RF power to a plasma load, where each pulse comprises RF power having a controllable frequency, and where a plasma having the plasma load interacts with a dummy substrate, or no substrate, in a plasma chamber; tuning an initial RF frequency for each pulse in a string of pulses, pulse to pulse, in a calibration process, by minimizing a difference between a characteristic indicative of the pulsed RF power at a start of each pulse and a desired characteristic of the pulsed RF power at a start of each pulse until the difference between the characteristic for a start to two consecutive pulses is below a threshold; then selecting the initial RF frequency as a fixed initial RF frequency for use in a processing run using a real substrate; and tuning the RF frequency during processing within each pulse but returning to the fixed initial RF frequency at a start of each pulse.
地址 Fort Collins CO US