发明名称 |
Semiconductor Device And Bump Formation Process |
摘要 |
A semiconductor device includes a solder bump overlying and electrically connected to a pad region, and a metal cap layer formed on at least a portion of the solder bump. The metal cap layer has a melting temperature greater than the melting temperature of the solder bump. |
申请公布号 |
US2017005051(A1) |
申请公布日期 |
2017.01.05 |
申请号 |
US201615269212 |
申请日期 |
2016.09.19 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Hsiao Yi-Li;Yu Chen-Hua;Jeng Shin-Puu;Tung Chih-Hang;Wei Cheng-Chang |
分类号 |
H01L23/00 |
主分类号 |
H01L23/00 |
代理机构 |
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代理人 |
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主权项 |
1. A method of forming a packaging assembly, the method comprising disposing a bump structure between a semiconductor substrate and a package substrate, the bump structure electrically connecting the semiconductor substrate to the package substrate, wherein the bump structure comprises a solder bump and a metal cap layer covering at least a portion of the solder bump while a top portion of the solder bump remains exposed, and the metal cap layer has a melting temperature greater than a melting temperature of the solder bump. |
地址 |
Hsin-Chu TW |