发明名称 Semiconductor Device And Bump Formation Process
摘要 A semiconductor device includes a solder bump overlying and electrically connected to a pad region, and a metal cap layer formed on at least a portion of the solder bump. The metal cap layer has a melting temperature greater than the melting temperature of the solder bump.
申请公布号 US2017005051(A1) 申请公布日期 2017.01.05
申请号 US201615269212 申请日期 2016.09.19
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Hsiao Yi-Li;Yu Chen-Hua;Jeng Shin-Puu;Tung Chih-Hang;Wei Cheng-Chang
分类号 H01L23/00 主分类号 H01L23/00
代理机构 代理人
主权项 1. A method of forming a packaging assembly, the method comprising disposing a bump structure between a semiconductor substrate and a package substrate, the bump structure electrically connecting the semiconductor substrate to the package substrate, wherein the bump structure comprises a solder bump and a metal cap layer covering at least a portion of the solder bump while a top portion of the solder bump remains exposed, and the metal cap layer has a melting temperature greater than a melting temperature of the solder bump.
地址 Hsin-Chu TW