| 发明名称 |
Target Material Thickness Measuring Apparatus |
| 摘要 |
Embodiments of the present invention disclose a target material thickness measuring apparatus including: a support; and a plurality of distance measuring units mounted on the support and arranged in a first direction, the plurality of distance measuring units being configured to respectively measure thicknesses of portions of a target material at a plurality of positions in the first direction. A plurality of thickness values of different portions of the target material along a straight line can be obtained at one time, for example, by performing a single measurement of thicknesses of the portions of the target material at the plurality of positions by means of the plurality of distance measuring units, thereby improving measurement efficiency. |
| 申请公布号 |
US2016349037(A1) |
申请公布日期 |
2016.12.01 |
| 申请号 |
US201514913163 |
申请日期 |
2015.07.28 |
| 申请人 |
BOE Technology Group Co., Ltd. ;Hefei Xinsheng Optoelectronics Technology Co., Ltd. |
发明人 |
Wang Deyong;Li Yefa;Peng Liang;Zheng Congqi;Choi Daeyoung |
| 分类号 |
G01B11/06 |
主分类号 |
G01B11/06 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A target material thickness measuring apparatus, comprising:
a support; and a plurality of distance measuring units mounted on the support and arranged in a first direction, the plurality of distance measuring units being configured to measure respectively thicknesses of portions of a target material at a plurality of positions in the first direction. |
| 地址 |
Beijing CN |
