发明名称 半導体装置
摘要 A semiconductor device which is miniaturized and has sufficient electrical characteristics to function as a transistor is provided. In a semiconductor device including a transistor in which a semiconductor layer, a gate insulating layer, and a gate electrode layer are stacked in that order, an oxide semiconductor film which contains at least four kinds of elements of indium, gallium, zinc, and oxygen, and in which the percentage of the indium is twice or more as large as each of the percentage of the gallium and the percentage of the zinc when the composition of the four elements is expressed in atomic percentage is used as the semiconductor layer. In the semiconductor device, the oxide semiconductor film is a film to which oxygen is introduced in the manufacturing process and contains a large amount of oxygen, and an insulating layer including an aluminum oxide film is provided to cover the transistor.
申请公布号 JP6016532(B2) 申请公布日期 2016.10.26
申请号 JP20120189399 申请日期 2012.08.30
申请人 株式会社半導体エネルギー研究所 发明人 山出 直人;肥塚 純一
分类号 H01L21/336;G02F1/1368;H01L21/8234;H01L21/8242;H01L21/8247;H01L27/06;H01L27/08;H01L27/088;H01L27/105;H01L27/108;H01L27/115;H01L29/786;H01L29/788;H01L29/792 主分类号 H01L21/336
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