发明名称 エレベータの点検装置
摘要 PROBLEM TO BE SOLVED: To provide an inspection device for an elevator which can automatically inspect an interlock mechanism without providing marking to a latch fitting or a hook fitting.SOLUTION: The inspection device for an elevator includes: a camera 21 for photographing the interlock mechanism comprising the latch fitting 8, the hook fitting 5 and a lock switch; an image extraction section 22 for obtaining a predetermined extraction image from images photographed by the camera 21; an image measurement section 24 for measuring an interval dimension between the hook fitting 5 and the latch fitting 8 in a predetermined operation state of the interlock mechanism based on the extraction image obtained by the image extraction section 22; and a determination section 25 for determining whether the interval dimension measured by the image measurement section 24 is in a range of a determination value 26 having a predetermined region.
申请公布号 JP5948205(B2) 申请公布日期 2016.07.06
申请号 JP20120224157 申请日期 2012.10.09
申请人 株式会社日立ビルシステム 发明人 北原 博道
分类号 B66B5/00 主分类号 B66B5/00
代理机构 代理人
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