| 摘要 |
The invention relates to a method for checking a support comprising a metal substrate, a dielectric coating, and a conductive layer. More specifically, the invention relates to a method for checking a support (5) formed by an assembly (25) which has no optoelectronic properties and which comprises, successively, a metal substrate (27), a dielectric coating (29) disposed on the metal substrate (27), and an electrically conductive layer (31) disposed on the dielectric coating (29), said method comprising at least the following steps: provision of the support (5); electrical excitation of the support (5), obtained by bringing the metal substrate (27) and the electrically conductive layer (31) into electrical contact with a voltage source (33); and photothermal examination of the excited support (5) so as to detect any possible fault (49, 51) located at least partially in the dielectric coating (29) and to provide a photothermal examination result. |
