发明名称 |
Controlling phase response in a sub-wavelength grating lens |
摘要 |
A sub-wavelength grating device having controlled phase response includes a grating layer having line widths, line thicknesses, line periods, and line spacings selected to produce a first level of control in phase changes of different portions of a beam of light reflected from the grating layer. The device also includes a substrate affixed to the grating layer that produces a second level of control in phase changes of different portions of a beam of light reflected from the grating layer, the second level of control being accomplished abrupt stepping of the substrate in a horizontal dimension, ramping the substrate in a horizontal dimension, or changing the index of refraction in a horizontal dimension. |
申请公布号 |
US9354363(B2) |
申请公布日期 |
2016.05.31 |
申请号 |
US201013640348 |
申请日期 |
2010.04.13 |
申请人 |
Hewlett Packard Enterprise Development LP |
发明人 |
Wu Wei;Williams R. Stanley;Li Jingjing;Kamins Theodore I.;Fiorentino Marco |
分类号 |
G02B5/18;B05D5/06 |
主分类号 |
G02B5/18 |
代理机构 |
Hewlett Packard Enterprise Patent Department |
代理人 |
Hewlett Packard Enterprise Patent Department |
主权项 |
1. A sub-wavelength grating device having a controlled phase response, comprising:
a grating layer having line widths, line thicknesses, line periods, and line spacings selected to produce a first level of control in phase changes of different portions of a beam of light incident on the sub-wavelength grating device; and a substrate affixed to the grating layer that produces a second level of control in the phase changes of the different portions of the beam of light, the second level of control being accomplished by changing an index of refraction of the substrate in the horizontal dimension, wherein the index of refraction of the substrate is modified in a substantially continuous manner along the horizontal dimension. |
地址 |
Houston TX US |