| 发明名称 |
METHOD AND APPARATUS FOR DETERMINING OBJECT CHARACTERISTICS |
| 摘要 |
Embodiments of the invention provide a method of determining one or more characteristics of a target object, comprising recording one or more diffraction patterns at a detector, wherein each diffraction pattern is formed by a target object scattering incident radiation, determining a phase map for at least a region of the target object based on the one or more diffraction patterns, and determining a refractive property of the target object based on the phase map. |
| 申请公布号 |
US2016138999(A1) |
申请公布日期 |
2016.05.19 |
| 申请号 |
US201615001887 |
申请日期 |
2016.01.20 |
| 申请人 |
PHASE FOCUS LIMITED |
发明人 |
Humphry Martin James;Langley Kevin;Russell James;Maiden Andrew Michael |
| 分类号 |
G01M11/02;G01M11/08 |
主分类号 |
G01M11/02 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method of determining one or more characteristics of a target object, comprising:
recording one or more diffraction patterns at a detector, wherein each diffraction pattern is formed by a target object scattering incident radiation; determining a phase map for at least a region of the target object based on the one or more diffraction patterns; and determining a refractive property of the target object based on the phase map. |
| 地址 |
Sheffield GB |
