发明名称 INSPECTION DEVICE FOR ELECTRONIC ASSEMBLY
摘要 PROBLEM TO BE SOLVED: To provide an inspection device of an electronic assembly for improving the accuracy of, especially, operation value inspection, and to provide the inspection device of an electronic assembly for improving the accuracy of appearance inspection.SOLUTION: An inspection device of an electronic assembly includes: a work table 110; a work holder 120 for holding an electronic assembly 10 to be inspected on a work table 110; a coil part 130 for allowing a lead switch 4 integrated into the electronic assembly 10 held by the work holder 120 to operate; and a measurement control device 200 for allowing the lead switch 4 to operate, and for measuring an operation value including the working value and/or release value. The measurement control device 200 includes: a condition setting part 206 for arbitrarily setting the specification and measurement condition of the operation value in the lead switch 4; an operation control part 207 for allowing the lead switch 4 of the electronic assembly 10 held by the work holder 120 to operate; an operation value measurement part 208 for measuring the operation value of the lead switch 4; and a success/failure determination part 211 for determining success/failure from the measured operation value.SELECTED DRAWING: Figure 1
申请公布号 JP2016085126(A) 申请公布日期 2016.05.19
申请号 JP20140218246 申请日期 2014.10.27
申请人 NANKA:KK 发明人 UEZONO MAMORU
分类号 G01R31/00 主分类号 G01R31/00
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