发明名称 Wafer polishing tool using abrasive tape
摘要 An embodiment wafer polishing tool includes an abrasive tape, a polish head holding the abrasive tape, and a rotation module. The rotation module is configured to rotate a wafer during a wafer polishing process, and the polish head is configured to apply pressure to the abrasive tape toward a first surface of the wafer during the wafer polishing process.
申请公布号 US9339912(B2) 申请公布日期 2016.05.17
申请号 US201313836534 申请日期 2013.03.15
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Chang Tang-Kuei;Wei Kuo-Hsiu;Chen Kei-Wei;Lo Wei-Jen;Wang Ying-Lang
分类号 B24B21/04;B24B9/06;B24B21/00 主分类号 B24B21/04
代理机构 Slater Matsil, LLP 代理人 Slater Matsil, LLP
主权项 1. A wafer polishing tool, comprising: a polishing head configured to hold an abrasive tape; a rotation module configured to rotate a wafer during a wafer polishing process, wherein the polishing head is configured to rotate the abrasive tape around an axis and press the abrasive tape on a first region of a first surface of the wafer during the wafer polishing process, wherein the first region is smaller than the first surface, wherein the axis intersects the abrasive tape, and wherein the polishing head is configured to rotate the abrasive tape in a plane parallel to the first surface of the wafer during the wafer polishing process; and a bottom plate configured to provide support on a second region of a second surface of the wafer opposite the first surface during the wafer polishing process, wherein the first region of the first surface is directly opposite the second region of the second surface, wherein the bottom plate has a width smaller than a diameter of the wafer.
地址 Hsin-Chu TW