Scan test circuit, test pattern generation control circuit, and scan test control method

摘要

A scan test generation method includes dividing a single clock domain into a plurality of regions; incorporating a test pattern generation control circuit in each of the regions; selecting one of a skewed-load mode and a broadside mode as a test pattern generation mode by the test pattern generation control circuit for each region; generating a test pattern determined based on selected one of the test pattern generation mode for each region; and generating a test pattern such that the skewed-load mode and the broadside mode are mixed in a single clock domain.

主权项

1. A scan test generation method comprising:
dividing a single clock domain into a plurality of regions; incorporating a test pattern generation control circuit in each of the regions; selecting one of a skewed-load mode and a broadside mode as a test pattern generation mode by the test pattern generation control circuit for each region; generating a test pattern determined based on a selected one of the test pattern generation mode for each region; and generating a test pattern such that the skewed-load mode and the broadside mode are mixed in a single clock domain.