发明名称 Distortion measurement for limiting jitter in PAM transmitters
摘要 Methods and test equipment for measuring jitter in a Pulse Amplitude Modulated (PAM) transmitter. Under one procedure, a first two-level PAM signal test pattern is used to measure clock-related jitter separated into random and deterministic components, while a second two-level PAM signal test pattern is used to measure even-odd jitter (EOJ). Under another procedure, A four-level PAM signal test pattern is used to measure jitter-induced noise using distortion analysis. Test equipment are also disclosed for implementing various aspects of the test methods.
申请公布号 US9344203(B2) 申请公布日期 2016.05.17
申请号 US201514638507 申请日期 2015.03.04
申请人 Intel Corporation 发明人 Ran Adee O.
分类号 H04B3/46;H04B17/10;H04L1/20;H04L1/24;G01R31/317;H04L27/04;G01R29/027 主分类号 H04B3/46
代理机构 Law Office of R. Alan Burnett, PS 代理人 Law Office of R. Alan Burnett, PS
主权项 1. A method for measuring jitter in a four-level Pulse Amplitude Modulated (PAM4) transmitter, comprising: employing a first two-level PAM4 signal test pattern to measure clock-related jitter separated into random and deterministic components; and employing a second two-level PAM4 signal test pattern to measure even-odd jitter (EOJ), wherein the first two-level PAM4 signal test pattern comprises a ‘03’ pattern that is periodical at 2 unit intervals (UI), wherein the 0 and 3 respectively correspond to a lowest and highest signal level of a PAM4 signal.
地址 Santa Clara CA US