| 摘要 |
A slit lamp (1) for an objective eye examination comprises an observation optical system (2) and an illumination optical system (3) movable jointly in the directions of the (X, Y, Z) Cartesian axis and separately and angularly around a common axis (Z). The illumination optical system (3) comprises mydriatic illumination means (75) and filters (91) for selecting frequencies of infrared radiations to be used during an examination. |
