Automated magnetic particle and fluorescent penetrant defect detection system

摘要

A system and method to inspect flaws associated with a part (103). The system includes a first image capturing device (203) configured to capture a first set of images of the part (103) and a computer (207) operably associated with first image capturing device (203) and configured to receive and analyze the first set of images. The method includes treating the part (103) with a magnetic particle and fluorescent penetrant processing, capturing a first set of images of an outer surface of the part (103) with the first image capturing device (203), and identifying a part defect with an algorithm associated with the computer (207).