发明名称 PATTERN RECOGNITION DEVICE, PATTERN LEARNING DEVICE, PATTERN LEARNING METHOD, AND PATTERN LEARNING PROGRAM
摘要 PROBLEM TO BE SOLVED: To improve pattern recognition precision by making an evaluation function reach a minimization solution regardless of the form of a loss term and performing simultaneous rationalization of feature selection and feature conversion.SOLUTION: A pattern learning device includes: an initial value input section for inputting the initial value of the parameter of a discrimination function used for pattern recognition; a loss calculation section for calculating a loss term corresponding to a recognition error in an evaluation function for evaluating the discrimination function based on an input vector for learning; a regularization calculation section for calculating a regularization term in the evaluation function; a parameter update section for updating the parameter of the discrimination function such that the total sum of the loss term and the regularization term reduces; and a parameter output section for outputting the updated parameter of the discrimination function by the parameter update section. The regularization calculation section calculates a regularization term defined by ratio of norm using the feature conversion matrix of the discrimination function.SELECTED DRAWING: Figure 1
申请公布号 JP2016071684(A) 申请公布日期 2016.05.09
申请号 JP20140201180 申请日期 2014.09.30
申请人 NEC CORP 发明人 SATO ATSUSHI
分类号 G06T7/00 主分类号 G06T7/00
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