发明名称 INSTRUMENTATION DEVICE MONITORING SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide an instrumentation device monitoring system which easily recognizes abnormalities of input and output values of instrumentation devices.SOLUTION: An instrumentation device monitoring system comprises: a value obtaining unit 301 obtaining actual input and output values of a plurality of instrumentation devices 1A, 1B, 1C, 1D...; an estimation unit 302 performing a fuzzy regression analysis on the basis of the actual input and output values of the instrumentation devices 1B, 1C, 1D... except the instrumentation device 1A to be monitored, among the plurality of instrumentation devices 1A, 1B, 1C, 1D... and estimating an estimated value of the input and output values of the instrumentation device 1A to be monitored; and a display unit 400 capable of displaying the actual input and output values of the instrumentation device 1A to be monitored and estimated values with membership values of the input and output values of the instrumentation device 1A to be monitored. The display unit 400 displays differences between the actual input and output values and the estimated values for each of the membership values.SELECTED DRAWING: Figure 1
申请公布号 JP2016071456(A) 申请公布日期 2016.05.09
申请号 JP20140197428 申请日期 2014.09.26
申请人 AZBIL CORP 发明人 KIMURA DAISAKU;YAMAGATA KENICHI;ARAI MANABU
分类号 G05B23/02 主分类号 G05B23/02
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