发明名称 Methods of Forming Transistors
摘要 Some embodiments include methods of forming transistors. Recesses are formed to extend into semiconductor material. The recesses have upper regions lined with liner material and have segments of semiconductor material exposed along lower regions. Semiconductor material is isotropically etched through the exposed segments which transforms the recesses into openings having wide lower regions beneath narrow upper regions. Gate dielectric material is formed along sidewalls of the openings. Gate material is formed within the openings and over regions of the semiconductor material between the openings. Insulative material is formed down the center of each opening and entirely through the gate material. A segment of gate material extends from one of the openings to the other, and wraps around a pillar of the semiconductor material between the openings. The segment is a gate of a transistor. Source/drain regions are formed on opposing sides of the gate.
申请公布号 US2016126354(A1) 申请公布日期 2016.05.05
申请号 US201614992966 申请日期 2016.01.11
申请人 Micron Technology, Inc. 发明人 Pandey Deepak Chandra;Liu Haitao;Ahmed Fawad;Karda Kamal M.
分类号 H01L29/78;H01L29/423;H01L29/06;H01L27/088 主分类号 H01L29/78
代理机构 代理人
主权项
地址 Boise ID US