发明名称 |
POLISHING APPARATUS AND POLISHING METHOD |
摘要 |
A polishing apparatus capable of polishing a substrate while accurately measuring a temperature at a desired measuring point near a surface of the substrate is disclosed. The polishing apparatus includes: a polishing pad having a polishing surface for polishing a substrate; a polishing table supporting the polishing pad; a table motor configured to rotate the polishing table; a polishing head configured to press a surface of the substrate against the polishing surface of the polishing pad; a polishing liquid supply nozzle configured to supply a polishing liquid onto the polishing surface of the polishing pad; and a temperature sensor mounted to the polishing table. The temperature sensor is located so as to move across the surface of the substrate each time the polishing table makes one revolution. |
申请公布号 |
US2016121452(A1) |
申请公布日期 |
2016.05.05 |
申请号 |
US201514925063 |
申请日期 |
2015.10.28 |
申请人 |
EBARA CORPORATION |
发明人 |
TAKAHASHI Taro |
分类号 |
B24B37/015 |
主分类号 |
B24B37/015 |
代理机构 |
|
代理人 |
|
主权项 |
1. A polishing apparatus comprising:
a polishing pad having a polishing surface for polishing a substrate; a polishing table supporting the polishing pad; a table motor configured to rotate the polishing table; a polishing head configured to press a surface of the substrate against the polishing surface of the polishing pad; a polishing liquid supply nozzle configured to supply a polishing liquid onto the polishing surface of the polishing pad; and a temperature sensor mounted to the polishing table, the temperature sensor being located so as to move across the surface of the substrate each time the polishing table makes one revolution. |
地址 |
Tokyo JP |