发明名称 Exposure method, exposure apparatus, and method of manufacturing device
摘要 An exposure method comprises a calculation step of calculating a correction amount of a correction unit which corrects a change in imaging characteristics of a projection optical system based on at least one of parameters including a numerical aperture and effective light source of an illumination optical system, a numerical aperture of the projection optical system, and a size and pitch of a pattern, and an amount of change in environment condition in the projection optical system; and a correction step of making the correction unit operate in accordance with the correction amount calculated in the calculation step.
申请公布号 US9329489(B2) 申请公布日期 2016.05.03
申请号 US201313932753 申请日期 2013.07.01
申请人 CANON KABUSHIKI KAISHA 发明人 Kawanami Kentarou
分类号 G03B27/52;G03B27/68;G03B27/54;G03B27/32;G03F7/20 主分类号 G03B27/52
代理机构 Rossi, Kimms & McDowell LLP 代理人 Rossi, Kimms & McDowell LLP
主权项 1. An exposure method of illuminating a mask, on which a pattern is formed, using an illumination optical system, and projecting an image of a pattern of the illuminated mask onto a substrate through a projection optical system, the method comprising: a calculation step of calculating a correction amount of a correction unit which corrects imaging characteristics of the projection optical system based on an amount of change in an environment condition in the projection optical system and a coefficient defining a relationship between the amount of change in the environment condition and the correction amount of the correction unit, wherein the coefficient is a quadratic function of a numerical aperture of the illumination optical system and a numerical aperture of the projection optical system; and a correction step of making the correction unit operate in accordance with the correction amount calculated in the calculation step, wherein the calculation step includes: a coefficient value calculating step of calculating a value of the coefficient by substituting values of the numerical aperture of the illumination optical system and the numerical aperture of the projection optical system into the quadratic function; and a correction amount calculation step of calculating the correction amount of the correction unit using the amount of change in the environment condition and the calculated value of the coefficient.
地址 Tokyo JP