发明名称 顕微鏡対物レンズ機械検査機器
摘要 An objective testing module includes a module base configured for coupling with an objective turret of a microscope. The objective testing module includes a mechanical testing assembly. The mechanical testing assembly is configured to mechanically test a sample at macro scale or less, and quantitatively determine one or more properties of the sample based on the mechanical testing. The mechanical testing assembly optionally includes a probe and one or more transducers coupled with the probe. The transducer measures one or more of force applied to a sample by the probe or displacement of the probe within the sample. In operation, an optical instrument locates a test location on a sample and the objective testing module mechanically tests at the test location with the mechanical testing assembly at a macro scale or less. The mechanical testing assembly further determines one or more properties of the sample according to the mechanical test.
申请公布号 JP5909020(B2) 申请公布日期 2016.04.26
申请号 JP20150503276 申请日期 2013.03.13
申请人 ハイジトロン,インク.HYSITRON,INC. 发明人 アシフ,サイド アマヌラ サイド;ダーマ,ラジブ;メジャー,ライアン
分类号 G02B21/00;G01Q30/02;G02B7/04;G02B7/16 主分类号 G02B21/00
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